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FDSOI and Bulk CMOS SRAM Cell Resilience to Radiation Effects
Calienes Bartra, W.E., Vladimirescu, A., Reis, R.Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.07.133
Date:
September, 2016
File:
PDF, 1.57 MB
english, 2016