A novel defect depth measurement method based on Nonlinear...

Mechanical Systems and Signal Processing 2017 / 02 Vol. 85

A novel defect depth measurement method based on Nonlinear System Identification for pulsed thermographic inspection

Zhao, Yifan, Mehnen, Jörn, Sirikham, Adisorn, Roy, Rajkumar
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Volume:
85
Language:
english
Journal:
Mechanical Systems and Signal Processing
DOI:
10.1016/j.ymssp.2016.08.033
Date:
February, 2017
File:
PDF, 1.77 MB
english, 2017
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