[NanoScience and Technology] Helium Ion Microscopy || Helium Ion Microscopy for Two-Dimensional Materials
Hlawacek, Gregor, Gölzhäuser, ArminVolume:
10.1007/97
Year:
2016
Language:
english
DOI:
10.1007/978-3-319-41990-9_11
File:
PDF, 1.09 MB
english, 2016