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Comparative study of threading dislocations in GaN epitaxial layers by nondestructive methods
Romanitan, Cosmin, Gavrila, Raluca, Danila, MihaiVolume:
57
Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2016.09.021
Date:
January, 2017
File:
PDF, 1.32 MB
english, 2017