[IEEE 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2016.7.18-2016.7.21)] 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - BTI lifetime reliability of planar MOSFET versus FinFET for 16 nm technology node
Mahmoud, Mohamed Mounir, Soin, NorhayatiYear:
2016
DOI:
10.1109/IPFA.2016.7564296
File:
PDF, 161 KB
2016