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[IEEE 2016 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO) - Beijing, China (2016.7.27-2016.7.29)] 2016 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO) - Reliability modeling and testing techniques for RF/microwave power amplifiers
Cheng, Qian-Fu, Fu, Hai-Peng, Ma, Jian-GuoYear:
2016
Language:
english
DOI:
10.1109/NEMO.2016.7561653
File:
PDF, 3.24 MB
english, 2016