[IEEE 2016 IEEE International Instrumentation and...

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[IEEE 2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Taipei, Taiwan (2016.5.23-2016.5.26)] 2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings - Shielding effectiveness of multi-layered Cu and PET thin films from electromagnetic interference

Akiyama, Tatsuhiro, Sasaki, Miyu, Shinagawa, Mitsuru, Tanaka, Koichiro, Sato, Kenji, Asahi, Toshiaki
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Year:
2016
Language:
english
DOI:
10.1109/i2mtc.2016.7520499
File:
PDF, 507 KB
english, 2016
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