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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Developments in X-Ray Tomography X - X-ray micro-tomography for investigations of brain tissues on cellular level
Stock, Stuart R., Müller, Bert, Wang, Ge, Khimchenko, Anna, Schulz, Georg, Deyhle, Hans, Thalmann, Peter, Zanette, Irene, Zdora, Marie-Christine, Bikis, Christos, Hipp, Alexander C., Hieber, Simone E.Volume:
9967
Year:
2016
Language:
english
DOI:
10.1117/12.2237554
File:
PDF, 24.97 MB
english, 2016