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[IEEE 2016 International Conference on Electrical and Information Technologies (ICEIT) - Tangiers, Morocco (2016.5.4-2016.5.7)] 2016 International Conference on Electrical and Information Technologies (ICEIT) - Detection and localization of the open circuit fault using the park's approach: An overview
Bensouda, Fatima Zahra, Haddi, AliYear:
2016
Language:
english
DOI:
10.1109/EITech.2016.7519648
File:
PDF, 2.50 MB
english, 2016