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[IEEE 2016 IEEE AUTOTESTCON - Anaheim, CA, USA (2016.9.12-2016.9.15)] 2016 IEEE AUTOTESTCON - Utilization of the 5 th generation mobile networks for automated tests
Guney, Aydin, Tongul, HalilYear:
2016
Language:
english
DOI:
10.1109/autest.2016.7589599
File:
PDF, 463 KB
english, 2016