[IEEE 2016 17th International Conference on Electronic Packaging Technology (ICEPT) - Wuhan, China (2016.8.16-2016.8.19)] 2016 17th International Conference on Electronic Packaging Technology (ICEPT) - Thermally accelerated ageing test of 808nm high power diode laser arrays in CW mode
Nie, Zhiqiang, Lu, Yao, Wu, Dihai, Wang, Shuna, Zhang, Pu, Xiong, Lingling, Li, Xiaoning, Shen, Zenan, Wu, DiYear:
2016
Language:
english
DOI:
10.1109/icept.2016.7583100
File:
PDF, 1.76 MB
english, 2016