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[IEEE 2016 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2016.6.14-2016.6.16)] 2016 IEEE Symposium on VLSI Technology - Complete extraction of defect bands responsible for instabilities in n and pFinFETs
Rzepa, G., Waltl, M., Goes, W., Kaczer, B., Franco, J., Chiarella, T., Horiguchi, N., Grasser, T.Year:
2016
Language:
english
DOI:
10.1109/VLSIT.2016.7573437
File:
PDF, 896 KB
english, 2016