[IEEE 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2016.7.18-2016.7.21)] 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Film-profile-engineered IGZO thin-film transistors with gate/drain offset for high voltage operation
Wu, Ming-Hung, Lin, Horng-Chih, Li, Pei-Wen, Huang, Tiao-YuanYear:
2016
Language:
english
DOI:
10.1109/ipfa.2016.7564298
File:
PDF, 1.22 MB
english, 2016