Anomalous Electrical Properties Induced by...

IEEE Transactions on Nuclear Science 2016 / 10 Vol. 63; Iss. 5

Anomalous Electrical Properties Induced by Hot-Electron-Injection in 130-nm Partially Depleted SOI NMOSFETs Fabricated on Modified Wafer

Dai, Lihua, Bi, Dawei, Ning, Bingxu, Hu, Zhiyuan, Song, Lei, Liu, Xiaonian, Zhang, Mengying, Zhang, Zhengxuan, Zou, Shichang
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Volume:
63
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2016.2604342
Date:
October, 2016
File:
PDF, 3.13 MB
english, 2016
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