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Laser equipment for hardness evaluation of semiconductor elements exposed to heavy charged particles (Review)
Mavritskii, O. B., Chumakov, A. I., Egorov, A. N., Pechenkin, A. A., Nikiforov, A. Yu.Volume:
59
Language:
english
Journal:
Instruments and Experimental Techniques
DOI:
10.1134/S0020441216050122
Date:
September, 2016
File:
PDF, 2.98 MB
english, 2016