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[ACM Press ACM SIGGRAPH 2016 Posters - Anaheim, California (2016.07.24-2016.07.28)] ACM SIGGRAPH 2016 Posters on - SIGGRAPH '16 - Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness
Dobashi, Yoshinori, Ijiri, Takashi, Todo, Hideki, Iwasaki, Kei, Okabe, Makoto, Nishimura, SatoshiYear:
2016
Language:
english
DOI:
10.1145/2945078.2945106
File:
PDF, 851 KB
english, 2016