Drain current local variability from linear to saturation region in 28nm bulk NMOSFETs
Karatsori, T.A., Theodorou, C.G., Haendler, S., Dimitriadis, C.A., Ghibaudo, G.Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2016.10.020
Date:
October, 2016
File:
PDF, 1.42 MB
english, 2016