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[IEEE 2015 12th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - Qingdao, China (2015.7.16-2015.7.18)] 2015 12th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - Analog circuit fault diagnosis using wavelet feature optimization approach
Song Guoming,, Li Qi,, Luo Gang,, Jiang Shuyan,, Wang Houjun,Year:
2015
Language:
english
DOI:
10.1109/icemi.2015.7494225
File:
PDF, 4.21 MB
english, 2015