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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Advances in X-Ray/EUV Optics and Components XI - Bent diamond-crystal x-ray spectrographs for x-ray free-electron laser noninvasive diagnostics
Khounsary, Ali M., Goto, Shunji, Morawe, Christian, Terentyev, Sergey, Blank, Vladimir, Kolodziej, Tomasz, Shvyd'ko, YuriVolume:
9963
Year:
2016
Language:
english
DOI:
10.1117/12.2238006
File:
PDF, 3.93 MB
english, 2016