Enhancement of thermal stability and reliability of BaxSr2−xSiO4:Eu2+ phosphors by Ba2+ doping
Zou, Jun, Yang, Bobo, Zhu, Siman, Li, Jierong, Wang, FengchaoLanguage:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-016-5466-5
Date:
August, 2016
File:
PDF, 3.90 MB
english, 2016