[IEEE 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Garden Grove, CA, USA (2016.9.11-2016.9.16)] 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Predictive high voltage ESD device design methodology
Lee, Jian-Hsing, Iyer, Natarajan Mahadeva, Jain, Ruchil, Prabhu, ManjunathaYear:
2016
Language:
english
DOI:
10.1109/EOSESD.2016.7592525
File:
PDF, 1.32 MB
english, 2016