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[IEEE ESSDERC 2016 - 46th European Solid-State Device Research Conference - Lausanne, Switzerland (2016.9.12-2016.9.15)] 2016 46th European Solid-State Device Research Conference (ESSDERC) - Bipolar-switching operated phase change memory (PCM) for improved high-temperature reliability
Ciocchini, N., Laudato, M., Lacaita, A. L., Ielmini, D., Boniardi, M., Varesi, E., Fantini, P.Year:
2016
Language:
english
DOI:
10.1109/ESSDERC.2016.7599665
File:
PDF, 1.34 MB
english, 2016