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[IEEE 2016 IEEE European Test Symposium (ETS) - Amsterdam, Netherlands (2016.5.23-2016.5.27)] 2016 21th IEEE European Test Symposium (ETS) - Reliability enhancement of embedded memory with combination of aging-aware adaptive in-field self-repair and ECC
Mayuga, Gian, Yamato, Yuta, Yoneda, Tomokazu, Sato, Yasuo, Inoue, MichikoYear:
2016
Language:
english
DOI:
10.1109/ets.2016.7519284
File:
PDF, 591 KB
english, 2016