Secondary ion yields for vacuum-type electrospray droplet...

Rapid Communications in Mass Spectrometry 2016 / 10 Vol. 30; Iss. 20

Secondary ion yields for vacuum-type electrospray droplet beams measured with a triple focus time-of-flight analyzer

Ninomiya, Satoshi, Sakai, Yuji, Watanabe, Ryo, Sogou, Mauo, Miyayama, Takuya, Sakai, Daisuke, Watanabe, Katsumi, Chen, Lee Chuin, Hiraoka, Kenzo
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
30
Language:
english
Journal:
Rapid Communications in Mass Spectrometry
DOI:
10.1002/rcm.7703
Date:
October, 2016
File:
PDF, 357 KB
english, 2016
Conversion to is in progress
Conversion to is failed