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High-Temperature In situ Deformation of GaAs Micro-pillars: Lithography Versus FIB Machining
Chen, M., Wehrs, J., Michler, J., Wheeler, J. M.Volume:
68
Language:
english
Journal:
JOM
DOI:
10.1007/s11837-016-2106-8
Date:
November, 2016
File:
PDF, 3.60 MB
english, 2016