Highly Robust Neutral Plane Oxide TFTs Withstanding 0.25 mm Bending Radius for Stretchable Electronics
Kim, Yong-Hwan, Lee, Eunji, Um, Jae Gwang, Mativenga, Mallory, Jang, JinVolume:
6
Language:
english
Journal:
Scientific Reports
DOI:
10.1038/srep25734
Date:
May, 2016
File:
PDF, 1.57 MB
english, 2016