[IEEE 2016 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP) - Budapest, Hungary (2016.5.30-2016.6.2)] 2016 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP) - Gallium nitride MEMS resonators: How residual stress impacts design and performances
Morelle, Christophe, Theron, Didier, Grimbert, Bertrand, Roch-Jeune, Isabelle, Brandli, Virginie, Avramovic, Vanessa, Okada, Etienne, Faucher, MarcYear:
2016
Language:
english
DOI:
10.1109/DTIP.2016.7514881
File:
PDF, 1.16 MB
english, 2016