[IEEE 2016 International Conference on Electrical and Information Technologies (ICEIT) - Tangiers, Morocco (2016.5.4-2016.5.7)] 2016 International Conference on Electrical and Information Technologies (ICEIT) - Static behavior analysis of silicon carbide power MOSFET for temperature variations
Jouha, Wadia, Dherbecourt, Pascal, Joubert, Eric, El Oualkadi, AhmedYear:
2016
Language:
english
DOI:
10.1109/EITech.2016.7519605
File:
PDF, 460 KB
english, 2016