![](/img/cover-not-exists.png)
[IEEE 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Garden Grove, CA, USA (2016.9.11-2016.9.16)] 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Measurement of discharging currents through an IC due to the charged board event using a shielded Rogowski coil
Park, Junsik, Lee, Jongsung, Kim, Seongmoo, Jo, Cheolgu, Seol, Byongsu, Kim, JingookYear:
2016
Language:
english
DOI:
10.1109/EOSESD.2016.7592537
File:
PDF, 743 KB
english, 2016