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[IEEE 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Garden Grove, CA, USA (2016.9.11-2016.9.16)] 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - EDA approaches in identifying latchup risks
Khazhinsky, Michael, Domanski, Krzysztof, Quax, Guido, Ruth, Scott, Farbiz, Farzan, Trivedi, Nitesh, Gossner, HaraldYear:
2016
Language:
english
DOI:
10.1109/EOSESD.2016.7592552
File:
PDF, 566 KB
english, 2016