[IEEE ESSDERC 2016 - 46th European Solid-State Device Research Conference - Lausanne, Switzerland (2016.9.12-2016.9.15)] 2016 46th European Solid-State Device Research Conference (ESSDERC) - Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs
Lavieville, R., Karatsori, T., Theodorou, C., Barraud, S., Dimitriadis, C.A., Ghibaudo, G.Year:
2016
Language:
english
DOI:
10.1109/ESSDERC.2016.7599607
File:
PDF, 3.44 MB
english, 2016