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[IEEE ESSDERC 2016 - 46th European Solid-State Device Research Conference - Lausanne, Switzerland (2016.9.12-2016.9.15)] 2016 46th European Solid-State Device Research Conference (ESSDERC) - A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer nMOSFETs
Sharma, Prateek, Tyaginov, Stanislav, Rauch, Stewart E., Franco, Jacopo, Kaczer, Ben, Makarov, Alexander, Vexler, Mikhail I., Grasser, TiborYear:
2016
Language:
english
DOI:
10.1109/ESSDERC.2016.7599677
File:
PDF, 2.72 MB
english, 2016