[IEEE 2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Taipei, Taiwan (2016.5.23-2016.5.26)] 2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings - Method of imaging and evaluation for defect based on pulsed eddy current
Shuhao, Zhao, Xuwei, Luo, Pingjie, Huang, Xiedan, Peng, Dibo, Hou, Guangxin, ZhangYear:
2016
Language:
english
DOI:
10.1109/I2MTC.2016.7520427
File:
PDF, 549 KB
english, 2016