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[IEEE 2016 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) - Chengdu, China (2016.7.20-2016.7.22)] 2016 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) - Study on the influence of antenna pattern on targets' near-field scattering characteristic
Wu, Sheng-Yuan, Zhang, Xiao-Kuan, Lin, Cun-Kun, Yuan, Jun-ChaoYear:
2016
Language:
english
DOI:
10.1109/IMWS-AMP.2016.7588388
File:
PDF, 759 KB
english, 2016