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[IEEE 2016 IEEE International Nanoelectronics Conference (INEC) - Chengdu, China (2016.5.9-2016.5.11)] 2016 IEEE International Nanoelectronics Conference (INEC) - Simulation study of an enhancement-mode n-type InGaAs MOSFETs with a low zero bias off-current
Gong, Zhujing, Chang, Hudong, Wang, Shengkai, Li, Yue, Sun, Bing, Liu, HonggangYear:
2016
Language:
english
DOI:
10.1109/INEC.2016.7589334
File:
PDF, 240 KB
english, 2016