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[IEEE 2016 IEEE International Nanoelectronics Conference (INEC) - Chengdu, China (2016.5.9-2016.5.11)] 2016 IEEE International Nanoelectronics Conference (INEC) - Too noisy at the nanoscale? — The rise of random telegraph noise (RTN) in devices and circuits
Wang, Runsheng, Guo, Shaofeng, Ren, Pengpeng, Luo, Mulong, Zou, Jibin, Huang, RuYear:
2016
DOI:
10.1109/INEC.2016.7589405
File:
PDF, 161 KB
2016