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[IEEE 2016 IEEE International Nanoelectronics Conference (INEC) - Chengdu, China (2016.5.9-2016.5.11)] 2016 IEEE International Nanoelectronics Conference (INEC) - Current enhanced double-gate TFET with source pocket and asymmetric gate oxide
Yu, Zhonghua, Dong, Yunpeng, Lin, Xinnan, Zhang, LiningYear:
2016
DOI:
10.1109/INEC.2016.7589410
File:
PDF, 789 KB
2016