[IEEE 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Sant Feliu de Guixols, Spain (2016.7.4-2016.7.6)] 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Leakage mitigation for low power microcontroller design in 40nm for Internet-of-Things (IoT)
Kapoor, Ajay, Engin, Nur, Verdaasdonk, JohanYear:
2016
DOI:
10.1109/IOLTS.2016.7604684
File:
PDF, 415 KB
2016