[IEEE 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Sant Feliu de Guixols, Spain (2016.7.4-2016.7.6)] 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Evaluation of machine learning algorithms for image quality assessment
Tchendjou, Ghislain Takam, Alhakim, Rshdee, Simeu, Emmanuel, Lebowsky, FritzYear:
2016
Language:
english
DOI:
10.1109/IOLTS.2016.7604697
File:
PDF, 95 KB
english, 2016