[IEEE 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Sant Feliu de Guixols, Spain (2016.7.4-2016.7.6)] 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) - On the influence of compiler optimizations in the fault tolerance of embedded systems
Serrano-Cases, Alejandro, Isaza-Gonzalez, Jose, Cuenca-Asensi, Sergio, Martinez-Alvarez, AntonioYear:
2016
Language:
english
DOI:
10.1109/IOLTS.2016.7604701
File:
PDF, 146 KB
english, 2016