[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Systematic transient characterization of graphene interconnects for on-chip ESD protection
Chen, Qi, Ma, Rui, Lu, Fei, Wang, Chenkun, Liu, Ming, Wang, Albert, Zhang, Wei, Xia, Ming, Xie, Ya-Hong, Cheng, YuhuaYear:
2016
Language:
english
DOI:
10.1109/IRPS.2016.7574521
File:
PDF, 1.02 MB
english, 2016