[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Temperature dependence of soft-error rates for FF designs in 20-nm bulk planar and 16-nm bulk FinFET technologies
Zhang, H., Jiang, H., Assis, T. R., Ball, D. R., Ni, K., Kauppila, J. S., Schrimpf, R. D., Massengill, L.W., Bhuva, B. L., Narasimham, B., Hatami, S., Anvar, A., Lin, A., Wang, J. K.Year:
2016
Language:
english
DOI:
10.1109/IRPS.2016.7574554
File:
PDF, 532 KB
english, 2016