[IEEE 2016 International Conference on Optical MEMS and Nanophotonics (OMN) - Singapore, Singapore (2016.7.31-2016.8.4)] 2016 International Conference on Optical MEMS and Nanophotonics (OMN) - Characterization of highly-doped GaN as a new material for plasmonic applications
Wetterau, L., Ravikiran, L., Dharmarasu, N., Radhakrishnan, K., Agrawal, M., Kusserow, T.Year:
2016
Language:
english
DOI:
10.1109/OMN.2016.7565937
File:
PDF, 369 KB
english, 2016