A 65 nm Temporally Hardened Flip-Flop Circuit

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IEEE Transactions on Nuclear Science 2016

A 65 nm Temporally Hardened Flip-Flop Circuit

Li, Yuanqing, Wang, Haibin, Liu, Rui, Chen, Li, Nofal, Issam, Chen, Qingyu, He, Anlin, Guo, Gang, Baeg, Sang Hyeon, Wen, Shi-Jie, Wong, Richard, Wu, Qiong, Chen, Mo
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Year:
2016
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2016.2608911
File:
PDF, 887 KB
english, 2016
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