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Analysis of Bulk FinFET Structural Effects on Single-Event Cross Sections
Nsengiyumva, Patrick, Massengill, Lloyd W., Alles, Michael L., Bhuva, Bharat L., Ball, Dennis R., Kauppila, Jeffrey S., Haeffner, Timothy D., Holman, W. Timothy, Reed, Robert A.Year:
2016
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2016.2620940
File:
PDF, 2.64 MB
english, 2016