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SPIE Proceedings [SPIE SPIE Security + Defence - Edinburgh, United Kingdom (Monday 26 September 2016)] Electro-Optical and Infrared Systems: Technology and Applications XIII - Analysis of the variation of range parameters of thermal cameras
Huckridge, David A., Ebert, Reinhard, Lee, Stephen T., Bareła, Jarosław, Kastek, Mariusz, Firmanty, Krzysztof, Krupiński, MichałVolume:
9987
Year:
2016
Language:
english
DOI:
10.1117/12.2241060
File:
PDF, 770 KB
english, 2016