SPIE Proceedings [SPIE First International Workshop on Pattern Recognition - Tokyo, Japan (Wednesday 11 May 2016)] First International Workshop on Pattern Recognition - Development of the rounded objects automatic detection method for the log deck volume measurement
Jiang, Xudong, Chen, Guojian, Capi, Genci, Ishll, Chiharu, Kruglov, Artem V.Volume:
10011
Year:
2016
Language:
english
DOI:
10.1117/12.2242172
File:
PDF, 921 KB
english, 2016