SPIE Proceedings [SPIE First International Workshop on...

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SPIE Proceedings [SPIE First International Workshop on Pattern Recognition - Tokyo, Japan (Wednesday 11 May 2016)] First International Workshop on Pattern Recognition - A depth-based super-resolution method for multi-view color images

Jiang, Xudong, Chen, Guojian, Capi, Genci, Ishll, Chiharu, Fan, Jun, Zeng, Xiangrong, Huangpeng, Qizi, Zhou, Jinglun, Feng, Jing
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Volume:
10011
Year:
2016
Language:
english
DOI:
10.1117/12.2242810
File:
PDF, 556 KB
english, 2016
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