[IEEE 2016 IEEE AUTOTESTCON - Anaheim, CA, USA (2016.9.12-2016.9.15)] 2016 IEEE AUTOTESTCON - U-TEST® — An innovative test platform to accelerate the entry-into-service of military and civil electronic systems
Foussereau, Loup, Delfour, Gerard, Ardussi, JohnYear:
2016
Language:
english
DOI:
10.1109/AUTEST.2016.7589580
File:
PDF, 534 KB
english, 2016