[IEEE 2016 IEEE International Reliability Physics Symposium...

  • Main
  • [IEEE 2016 IEEE International...

[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Power-supply impact on the reliability of mid-1X TLC NAND flash memories

Zambelli, Cristian, King, Pietro, Olivo, Piero, Crippa, Luca, Micheloni, Rino
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2016
Language:
english
DOI:
10.1109/IRPS.2016.7574509
File:
PDF, 506 KB
english, 2016
Conversion to is in progress
Conversion to is failed