[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Power-supply impact on the reliability of mid-1X TLC NAND flash memories
Zambelli, Cristian, King, Pietro, Olivo, Piero, Crippa, Luca, Micheloni, RinoYear:
2016
Language:
english
DOI:
10.1109/IRPS.2016.7574509
File:
PDF, 506 KB
english, 2016